Final edits
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@ -71,9 +71,9 @@
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\vspace*{1mm}
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\vspace*{1mm}
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\begin{itemize}
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\begin{itemize}
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\item High bandwidth, low power consumption, small size
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\item High bandwidth, low noise figure, low power consumption, small size
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\item Applicable to electronic beam stearing for mm-Wave
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\item Applicable to electronic beam stearing for mm-Wave
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\item SiGe BiCMOS technology (B11HFC) from Infineon Technologies AG with $f_\text{t}/f_\text{max}$ of $250/\SI{370}{\giga\hertz}$
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\item 130nm SiGe BiCMOS technology from Infineon Technologies AG with $f_\text{t}/f_\text{max}$ of $250/\SI{370}{\giga\hertz}$
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\end{itemize}
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\end{itemize}
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\vspace*{2mm}
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\vspace*{2mm}
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@ -18,7 +18,7 @@
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\item SQuad, TIA \& Buffer
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\item SQuad, TIA \& Buffer
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\end{itemize}
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\end{itemize}
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\item Further iterative optimization of parameters (e.g., determine LO power,\\ increase buffer current for linearity, \ldots)
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\item Further iterative optimization of parameters (e.g., determine LO power,\\ increase buffer current for linearity, \ldots)
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\item Matching of input and output
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\item Matching
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\end{enumerate}
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\end{enumerate}
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\end{frame}
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\end{frame}
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@ -288,6 +288,7 @@
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\begin{itemize}
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\begin{itemize}
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\item Conversion gain
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\item Conversion gain
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\item $\SI{1}{dB}$ compression point ($P_{\SI{1}{dB}}$)
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\item $\SI{1}{dB}$ compression point ($P_{\SI{1}{dB}}$)
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\item Noise figure
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\end{itemize}
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\end{itemize}
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\end{itemize}
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\end{itemize}
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\end{minipage}%
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\end{minipage}%
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@ -402,6 +403,7 @@
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\begin{itemize}
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\begin{itemize}
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\item Conversion gain
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\item Conversion gain
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\item $\SI{1}{dB}$ compression point ($P_{\SI{1}{dB}}$)
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\item $\SI{1}{dB}$ compression point ($P_{\SI{1}{dB}}$)
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\item Noise figure
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\end{itemize}
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\end{itemize}
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\end{itemize}
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\end{itemize}
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\end{minipage}%
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\end{minipage}%
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@ -5,6 +5,12 @@
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\frametitle{Discussion \& Conclusion}
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\frametitle{Discussion \& Conclusion}
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\begin{itemize}
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\begin{itemize}
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\item Own simulations
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\begin{itemize}
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\item Better results to be expected (technology with higher $f_\text{t}$, $f_\text{max}$, stability not considered)
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\item Maybe better results by using current mirrors to set operating points of buffer instead of resistors
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\end{itemize}
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\bigskip
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\item General structure
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\item General structure
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\begin{itemize}
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\begin{itemize}
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\item Removal of $g_\text{m}$ stage of Gilbert cell $\rightarrow$ more voltage headroom
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\item Removal of $g_\text{m}$ stage of Gilbert cell $\rightarrow$ more voltage headroom
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@ -12,14 +18,6 @@
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\item Differential to single-ended conversion $\rightarrow$ dense chip-to-package transition
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\item Differential to single-ended conversion $\rightarrow$ dense chip-to-package transition
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\end{itemize}
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\end{itemize}
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\bigskip
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\bigskip
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\item Own simulations
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\begin{itemize}
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\item Better results to be expected (technology with higher $f_\text{t}$, $f_\text{max}$, stability not considered)
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\item Further investigation needed to determine whether unusual LO power behavior is problematic
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\item Maybe better results by using current mirrors to set operating points of buffer instead of resistors
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\item Maybe better results by replacement of discrete component matching networks by transmission line based ones
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\end{itemize}
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\bigskip
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\item Applications of this design
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\item Applications of this design
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\begin{itemize}
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\begin{itemize}
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\item SiGe HBT technology integrable with CMOS $\rightarrow$ scalable, suitable for mixed-signal ICs
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\item SiGe HBT technology integrable with CMOS $\rightarrow$ scalable, suitable for mixed-signal ICs
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