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@@ -25,7 +25,7 @@ introduces two new challenges \cite[Sec.~4]{gottesman_introduction_2009}:
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hardware themselves.
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hardware themselves.
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\end{itemize}
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\end{itemize}
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In the literature, both of these points are viewed under the umbrella
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In the literature, both of these points are viewed under the umbrella
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of \emph{fault tolerance}.
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of \emph{fault-tolerant} quantum computing.
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We focus only on the second aspect in this work.
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We focus only on the second aspect in this work.
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It was recognized early on as a challenge of \ac{qec} that the correction
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It was recognized early on as a challenge of \ac{qec} that the correction
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@@ -188,9 +188,11 @@ We visualize the different types of noise models in
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The simplest type of noise model is \emph{bit-flip} noise.
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The simplest type of noise model is \emph{bit-flip} noise.
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This corresponds to the classical \ac{bsc}, i.e., only $X$ errors on the
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This corresponds to the classical \ac{bsc}, i.e., only $X$ errors on the
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data qubits are possible \cite[Appendix~A]{gidney_new_2023}.
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data qubits are possible \cite[Appendix~A]{gidney_new_2023}.
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The occurrence of bit-flip errors is modeled as a Bernoulli process
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$\text{Bern}(p)$.
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This type of noise model is shown in \Cref{subfig:bit_flip}.
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This type of noise model is shown in \Cref{subfig:bit_flip}.
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Note that we cannot use bit-flip noise to develop fault-tolerant
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Note that bit-flip noise is not suitable for developing fault-tolerant
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systems, as it does not account for errors during the syndrome extraction.
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systems, as it does not account for errors during the syndrome extraction.
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%%%%%%%%%%%%%%%%
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%%%%%%%%%%%%%%%%
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@@ -243,12 +245,12 @@ Here we not only consider noise between syndrome extraction rounds
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and at the measurements, but at each gate.
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and at the measurements, but at each gate.
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Specifically, we allow arbitrary $n$-qubit Pauli errors after each
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Specifically, we allow arbitrary $n$-qubit Pauli errors after each
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$n$-qubit gate \cite[Def.~2.5]{derks_designing_2025}.
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$n$-qubit gate \cite[Def.~2.5]{derks_designing_2025}.
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An $n$-qubit Pauli error is simply a series of correlated Pauli
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An $n$-qubit Pauli error can be written as a series of correlated Pauli
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errors on each related individual qubit.
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errors on each related individual qubit.
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This type of noise model is shown in \Cref{subfig:circuit_level}.
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This type of noise model is shown in \Cref{subfig:circuit_level}.
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While phenomenological noise is useful for some design aspects of
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While phenomenological noise is useful for some design aspects of
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fault tolerant circuitry, for simulations, circuit-level noise should
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fault-tolerant circuitry, for simulations, circuit-level noise should
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always be used \cite[Sec.~4.2]{derks_designing_2025}.
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always be used \cite[Sec.~4.2]{derks_designing_2025}.
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Note that this introduces new challenges during the decoding process,
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Note that this introduces new challenges during the decoding process,
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as the decoding complexity is increased considerably due to the many
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as the decoding complexity is increased considerably due to the many
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@@ -286,7 +288,7 @@ fault-tolerant \ac{qec} schemes.
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E.g., they can be used to easily determine whether a measurement
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E.g., they can be used to easily determine whether a measurement
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schedule is fault-tolerant \cite[Example~12]{derks_designing_2025}.
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schedule is fault-tolerant \cite[Example~12]{derks_designing_2025}.
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Other approaches of implementing fault tolerance exist, such as
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Other approaches of implementing fault-tolerance circuits exist, such as
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flag error correction, which uses additional ancilla qubits to detect
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flag error correction, which uses additional ancilla qubits to detect
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potentially damaging high-weight errors \cite[Sec.~1]{chamberland_flag_2018}.
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potentially damaging high-weight errors \cite[Sec.~1]{chamberland_flag_2018}.
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However, \acp{dem} offer some unique advantages
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However, \acp{dem} offer some unique advantages
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@@ -300,8 +302,7 @@ However, \acp{dem} offer some unique advantages
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treated in a unified manner. This leads to a more powerful
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treated in a unified manner. This leads to a more powerful
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description of the overall circuit.
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description of the overall circuit.
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\end{itemize}
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\end{itemize}
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In this work, we only consider the process of decoding under the
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In this work, we consider the process of decoding under the \ac{dem} framework.
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\ac{dem} framework.
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% Core idea
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% Core idea
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@@ -459,15 +460,22 @@ circuit, tracking which measurements they affect
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We turn to our example of the three-qubit repetition code to
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We turn to our example of the three-qubit repetition code to
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illustrate the construction of the syndrome measurement matrix.
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illustrate the construction of the syndrome measurement matrix.
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We begin by extending our check matrix in \Cref{eq:rep_code_H}
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We begin by extending our check matrix $\bm{H}_Z$ in
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to represent three rounds of syndrome extraction.
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\Cref{eq:rep_code_H} to represent three rounds of syndrome extraction.
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Each round yields an additional set of syndrome bits,
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Each round yields an additional set of syndrome bits,
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and we combine them by stacking them in a new vector
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and we combine them by stacking them in a new vector
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$\bm{s} \in \mathbb{F}_2^{R(n-k)}$.
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$\bm{s} \in \mathbb{F}_2^{R(n-k)}$, where $R \in \mathbb{N}$ is the
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We thus have to replicate the rows of $\bm{\Omega}$, once for each
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number of syndrome measurement rounds.
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We thus have to replicate the rows of $\bm{H}_Z$, once for each
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additional syndrome measurement, to obtain
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additional syndrome measurement, to obtain
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\begin{align*}
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\begin{align*}
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\bm{\Omega} =
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\bm{\Omega}_0 =
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\begin{pmatrix}
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\bm{H}_Z \\
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\bm{H}_Z \\
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\bm{H}_Z
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\end{pmatrix}
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=
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\begin{pmatrix}
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\begin{pmatrix}
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1 & 1 & 0 \\
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1 & 1 & 0 \\
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0 & 1 & 1 \\
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0 & 1 & 1 \\
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@@ -482,7 +490,7 @@ additional syndrome measurement, to obtain
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depicts the corresponding circuit.
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depicts the corresponding circuit.
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Note that we have not yet introduced error locations in the syndrome
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Note that we have not yet introduced error locations in the syndrome
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extraction circuitry, so we still consider only bit flip noise at this stage.
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extraction circuitry, so we still consider only bit flip noise at this stage.
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Recall that $\bm{\Omega}$ describes which \ac{vn} is connected to
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Recall that $\bm{\Omega}_0$ describes which \ac{vn} is connected to
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which parity check and the syndrome indicates which parity checks
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which parity check and the syndrome indicates which parity checks
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are violated.
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are violated.
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This means that if an error exists at only a single \ac{vn}, we can
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This means that if an error exists at only a single \ac{vn}, we can
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@@ -491,7 +499,7 @@ If errors occur at multiple locations, the resulting syndrome will be
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the linear combination of the respective columns.
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the linear combination of the respective columns.
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We thus have
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We thus have
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\begin{align*}
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\begin{align*}
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\bm{s} \in \text{span} \{\bm{\Omega}\}
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\bm{s} \in \text{span} \{\bm{\Omega}_0\}
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.%
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.%
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\end{align*}
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\end{align*}
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@@ -502,11 +510,11 @@ only considering $X$ errors in this case.
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We introduce new error locations at the appropriate positions,
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We introduce new error locations at the appropriate positions,
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arriving at the circuit depicted in
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arriving at the circuit depicted in
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\Cref{fig:rep_code_multiple_rounds_phenomenological}.
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\Cref{fig:rep_code_multiple_rounds_phenomenological}.
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For each additional error location, we extend $\bm{\Omega}$ by
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For each additional error location, we extend $\bm{\Omega}_0$ by
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appending the corresponding syndrome vector as a column.
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appending the corresponding syndrome vector as a column.
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\begin{gather}
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\begin{gather}
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\label{eq:syndrome_matrix_ex}
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\label{eq:syndrome_matrix_ex}
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\bm{\Omega} =
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\bm{\Omega}_1 =
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\left(
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\left(
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\begin{array}{ccccccccccccccc}
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\begin{array}{ccccccccccccccc}
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1 & 1 & 0 & 1 & 0 & 0 & 0 & 0 & 0 & 0
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1 & 1 & 0 & 1 & 0 & 0 & 0 & 0 & 0 & 0
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@@ -523,24 +531,25 @@ appending the corresponding syndrome vector as a column.
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& 0 & 1 & 1 & 0 & 1
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& 0 & 1 & 1 & 0 & 1
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\end{array}
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\end{array}
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\right) . \\[-6mm]
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\right) . \\[-6mm]
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\hspace*{-58.7mm}
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\hspace*{-56.7mm}
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\underbrace{
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\underbrace{
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\phantom{
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\phantom{
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\begin{array}{ccc}
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\begin{array}{ccc}
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0 & 0 & 0
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0 & 0 & 0
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\end{array}
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\end{array}
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}
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}
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}_\text{Original matrix}
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}_{\bm{\Omega}_0} \nonumber
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\end{gather}
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\end{gather}
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Notice that the first three columns correspond to the original
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Notice that the first three columns correspond to the original
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measurement syndrome matrix, as these columns correspond to the error
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measurement syndrome matrix $\bm{\Omega}_0$, as these columns
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locations on the data qubits.
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correspond to the error locations on the data qubits.
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In this example, all measurements we considered were syndrome measurements.
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In this example, all measurements we considered were syndrome measurements.
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Assuming no errors, the results of those measurements were
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Assuming no errors, the results of those measurements are
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deterministic, irrespective of the actual logical state
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deterministic: They are not subject to any probabilistic behavior
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$\ket{\psi}_\text{L}$, as they only depend on whether
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despite the quantum mechanical nature of the underlying system.
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$\ket{\psi}_\text{L} \in \mathcal{C}$, not on the concrete state.
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They only depend on whether $\ket{\psi}_\text{L} \in \mathcal{C}$,
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not on the concrete state.
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It is, in general, possible to also consider non-deterministic measurements.
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It is, in general, possible to also consider non-deterministic measurements.
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As an example, it is usual to consider a round of noiseless
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As an example, it is usual to consider a round of noiseless
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measurements of the actual data qubit states after the last syndrome
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measurements of the actual data qubit states after the last syndrome
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|
@@ -557,7 +566,7 @@ extraction round.
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\centering
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\centering
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\begin{tikzpicture}
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\begin{tikzpicture}
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\node{$%
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\node{$%
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\bm{\Omega} =
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\bm{\Omega}_0 =
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\begin{pmatrix}
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\begin{pmatrix}
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1 & 1 & 0 \\
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1 & 1 & 0 \\
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0 & 1 & 1 \\
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0 & 1 & 1 \\
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@@ -667,7 +676,7 @@ extraction round.
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\end{gather*}
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\end{gather*}
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\vspace*{-8mm}
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\vspace*{-8mm}
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\begin{gather*}
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\begin{gather*}
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\bm{\Omega} =
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\bm{\Omega}_1 =
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\left(
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\left(
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\begin{array}{
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\begin{array}{
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cccccc%
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cccccc%
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@@ -761,10 +770,10 @@ Instead of using stabilizer measurement results directly, we
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generalize the notion of what constitutes a parity check slightly.
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generalize the notion of what constitutes a parity check slightly.
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We formally define a \emph{detector} as a deterministic parity constraint on
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We formally define a \emph{detector} as a deterministic parity constraint on
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a set of measurement outcomes \cite[Def.~2.1]{derks_designing_2025}.
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a set of measurement outcomes \cite[Def.~2.1]{derks_designing_2025}.
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It can be seen that we will have as many linearly
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independent detectors as there are separate deterministic measurements.
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In the most straightforward case, we may simply use the stabilizer
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In the most straightforward case, we may simply use the stabilizer
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measurements as detectors.
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measurements as detectors.
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We immediately recognize that we will have as many linearly
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independent detectors as there are separate deterministic measurements.
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We generally aim to utilize the maximum number of linearly
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We generally aim to utilize the maximum number of linearly
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independent detectors \cite[Sec.~2.2]{derks_designing_2025}.
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independent detectors \cite[Sec.~2.2]{derks_designing_2025}.
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@@ -775,8 +784,8 @@ the \emph{detector matrix} $\bm{D} \in \mathbb{F}_2^{D\times M}$
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\cite[Def.~2.2]{derks_designing_2025}, with $~D\in \mathbb{N}$
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|
\cite[Def.~2.2]{derks_designing_2025}, with $~D\in \mathbb{N}$
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|
denoting the number of detectors.
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denoting the number of detectors.
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|
Similar to the way a \ac{pcm} associates bits with parity checks, the
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|
Similar to the way a \ac{pcm} associates bits with parity checks, the
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detector matrix links measurements and detectors.
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detector matrix links measurement outcomes and detectors.
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Each column corresponds to a measurement, while each rows corresponds
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Each column corresponds to a measurement, while each row corresponds
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to a detector.
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to a detector.
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We should note at this point that the combination of measurements
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We should note at this point that the combination of measurements
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into detectors has no bearing on the actual construction of the
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|
into detectors has no bearing on the actual construction of the
|
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|
@@ -786,12 +795,12 @@ affects the decoder.
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Note that we can use the detector matrix $\bm{D}$ to describe the set
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Note that we can use the detector matrix $\bm{D}$ to describe the set
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|
of possible measurement outcomes under the absence of noise.
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of possible measurement outcomes under the absence of noise.
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|
The same way we use a \ac{pcm} to describe the code space as
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|
Similar to the we use a \ac{pcm} to describe the code space as
|
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|
|
\begin{align*}
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|
|
\begin{equation*}
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|
\mathcal{C}
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|
\mathcal{C}
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|
= \{ \bm{x} \in \mathbb{F}_2^{n} : \bm{H}\bm{x}^\text{T} = \bm{0} \}
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|
= \{ \bm{x} \in \mathbb{F}_2^{n} : \bm{H}\bm{x}^\text{T} = \bm{0} \}
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,%
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,%
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\end{align*}
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|
\end{equation*}
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|
the set of possible measurement outcomes is simply $\text{kern}\{\bm{D}\}$
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|
the set of possible measurement outcomes is simply $\text{kern}\{\bm{D}\}$
|
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|
\cite[Sec.~2.2]{derks_designing_2025}.
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|
\cite[Sec.~2.2]{derks_designing_2025}.
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|
@@ -915,7 +924,8 @@ with $\bm{m}^{(0)} = \bm{0}$.
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|
We again turn our attention to the three-qubit repetition code.
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We again turn our attention to the three-qubit repetition code.
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In \Cref{fig:rep_code_multiple_rounds_phenomenological} we can see
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In \Cref{fig:rep_code_multiple_rounds_phenomenological} we can see
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that $E_6$ has occurred and has subsequently tripped the last four measurements.
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that $E_6$ has occurred and has subsequently triggered the last four
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measurements.
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We now take those measurements and combine them according to
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We now take those measurements and combine them according to
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\Cref{eq:measurement_combination}.
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\Cref{eq:measurement_combination}.
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We can see this process graphically in
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We can see this process graphically in
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@@ -923,13 +933,13 @@ We can see this process graphically in
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To understand why this way of defining the detectors is useful, we
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To understand why this way of defining the detectors is useful, we
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note that the error $E_6$ in
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note that the error $E_6$ in
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\Cref{fig:rep_code_multiple_rounds_phenomenological} has not only
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\Cref{fig:rep_code_multiple_rounds_phenomenological} has not only
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tripped the measurements in the syndrome extraction round immediately
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triggered the measurements in the syndrome extraction round immediately
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afterwards, but all subsequent ones as well.
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afterwards, but all subsequent ones as well.
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To only see errors in the rounds immediately following them, we
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To only see errors in the rounds immediately following them, we
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consider our newly defined detectors instead of the measurements,
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consider our newly defined detectors instead of the measurements,
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that effectively compute the difference between the measurements.
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that effectively compute the difference between the measurements.
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Each error can only trip syndrome bits that follow it.
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Each error can only trigger syndrome bits that follow it.
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This is reflected in the triangular structure of $\bm{\Omega}$ in
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This is reflected in the triangular structure of $\bm{\Omega}$ in
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\Cref{eq:syndrome_matrix_ex}.
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\Cref{eq:syndrome_matrix_ex}.
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Combining the measurements into detectors according to
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Combining the measurements into detectors according to
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@@ -949,7 +959,7 @@ The detector error matrix
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\end{array}
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\end{array}
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\right)
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\right)
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\end{align*}
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\end{align*}
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we obtain this way has a block-diagonal structure.
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obtained this way has a block-diagonal structure.
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Note that we exploit the fact that each syndrome measurement round is
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Note that we exploit the fact that each syndrome measurement round is
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identical to obtain this structure.
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identical to obtain this structure.
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@@ -1030,11 +1040,11 @@ measurements) models \cite[Sec.~2.1]{gidney_fault-tolerant_2021}.
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These differ in the way they compute individual error probabilities
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These differ in the way they compute individual error probabilities
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from the physical error rate.
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from the physical error rate.
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In this work we only consider \emph{standard circuit-based depolarizing
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In this work we consider the \emph{standard circuit-based depolarizing
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noise}, as this is the standard approach in the literature.
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noise} variant of circuit-level noise, as this is the standard
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We thus set the error probabilities of all error locations in the
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approach in the literature:
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circuit-level noise model to the same value, the physical error rate
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We set the error probabilities of all error locations to the same
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$p_\text{phys}$.
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value, the physical error rate $p_\text{phys}$.
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%%%%%%%%%%%%%%%%
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%%%%%%%%%%%%%%%%
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\subsection{Per-Round Logical Error Rate}
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\subsection{Per-Round Logical Error Rate}
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@@ -1065,13 +1075,12 @@ The overall probability of error is then
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\end{align}
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\end{align}
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We approximate $p_\text{e,total}$ using a Monte Carlo simulation and
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We approximate $p_\text{e,total}$ using a Monte Carlo simulation and
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compute the per-round-\ac{ler} using \Cref{eq:per_round_ler}.
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compute the per-round-\ac{ler} using \Cref{eq:per_round_ler}.
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This is a common approach taken in the literature
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This is the approach taken in \cite{gong_toward_2024}\cite{wang_fully_2025}.
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\cite{gong_toward_2024}\cite{wang_fully_2025}.
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Another common approach \cite{chen_exponential_2021}%
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Another approach \cite{chen_exponential_2021}%
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\cite{bausch_learning_2024}\cite{beni_tesseract_2025} is to assume an
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\cite{bausch_learning_2024}\cite{beni_tesseract_2025} is to assume an
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exponential decay for the decoder's \emph{logical fidelity}
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exponential decay for the decoder's \emph{logical fidelity}
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\cite[Eq.~2]{bausch_learning_2024}
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\cite[Eq.~(2)]{bausch_learning_2024}
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\begin{align*}
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\begin{align*}
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F_\text{total} = (F_\text{round})^{R}
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F_\text{total} = (F_\text{round})^{R}
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.%
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.%
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@@ -1079,7 +1088,7 @@ exponential decay for the decoder's \emph{logical fidelity}
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The logical fidelity is a measure of the quality of a logical state
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The logical fidelity is a measure of the quality of a logical state
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\cite[Appendix~E]{postler_demonstration_2024}.
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\cite[Appendix~E]{postler_demonstration_2024}.
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As it is related to the error rate through $F = 1 - 2p$, we obtain
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As it is related to the error rate through $F = 1 - 2p$, we obtain
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\cite[Eq.~4]{bausch_learning_2024}
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\cite[Eq.~(4)]{bausch_learning_2024}
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\begin{align}
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\begin{align}
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(1 - 2p_\text{e,total}) &= (1 - 2p_\text{e,round})^{R} \nonumber\\
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(1 - 2p_\text{e,total}) &= (1 - 2p_\text{e,round})^{R} \nonumber\\
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\implies \hspace{15mm} p_\text{e,round} &= \frac{1}{2}
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\implies \hspace{15mm} p_\text{e,round} &= \frac{1}{2}
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