Fix typos
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@@ -20,7 +20,7 @@ introduces two new challenges \cite[Sec.~4]{gottesman_introduction_2009}:
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\item \ac{qec} systems are themselves partially implemented in
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\item \ac{qec} systems are themselves partially implemented in
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quantum hardware. In addition to the errors we have
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quantum hardware. In addition to the errors we have
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originally introduced them for, these systems must
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originally introduced them for, these systems must
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be able to acount for the fact they are implemented on noisy
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be able to account for the fact they are implemented on noisy
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hardware themselves.
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hardware themselves.
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\end{itemize}
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\end{itemize}
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In the literature, both of these points are viewed under the umbrella
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In the literature, both of these points are viewed under the umbrella
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@@ -190,7 +190,7 @@ data qubits are possible \cite[Appendix~A]{gidney_new_2023}.
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This type of noise model is shown in \Cref{subfig:bit_flip}.
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This type of noise model is shown in \Cref{subfig:bit_flip}.
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Note that we cannot use bit-flip noise to develop fault-tolerant
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Note that we cannot use bit-flip noise to develop fault-tolerant
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systems, as it doesnt't account for errors during the syndrome extraction.
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systems, as it does not account for errors during the syndrome extraction.
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%%%%%%%%%%%%%%%%
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%%%%%%%%%%%%%%%%
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\subsection{Depolarizing Channel}
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\subsection{Depolarizing Channel}
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@@ -230,7 +230,7 @@ phenomenological noise is already a significant step beyond the code
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capacity noise models.
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capacity noise models.
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Additionally, there are applications where the
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Additionally, there are applications where the
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consideration of phenomenological noise is enough.
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consideration of phenomenological noise is enough.
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It can, for example, be used for guiding the design of fault-tolerant
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It can, for example, be used to guide the design of fault-tolerant
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circuitry [DTTBE25, Sec. 4.2].
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circuitry [DTTBE25, Sec. 4.2].
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%%%%%%%%%%%%%%%%
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%%%%%%%%%%%%%%%%
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@@ -238,7 +238,7 @@ circuitry [DTTBE25, Sec. 4.2].
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\label{subsec:Circuit-Level Noise}
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\label{subsec:Circuit-Level Noise}
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The most general type of noise model is \emph{circuit-level noise}.
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The most general type of noise model is \emph{circuit-level noise}.
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Here we not only consider noise inbetween syndrome extraction rounds
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Here we not only consider noise between syndrome extraction rounds
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and at the measurements, but at each gate.
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and at the measurements, but at each gate.
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Specifically, we allow arbitrary $n$-qubit Pauli errors after each
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Specifically, we allow arbitrary $n$-qubit Pauli errors after each
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$n$-qubit gate \cite[Def.~2.5]{derks_designing_2025}.
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$n$-qubit gate \cite[Def.~2.5]{derks_designing_2025}.
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@@ -277,7 +277,8 @@ error locations.
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\section{Detector Error Models}
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\section{Detector Error Models}
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\label{sec:Detector Error Models}
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\label{sec:Detector Error Models}
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\emph{Detector error models} (\acsp{dem}) constitue a standardized framework for
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\emph{Detector error models} (\acsp{dem}) constitute a standardized
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framework for
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passing information about a circuit used for \ac{qec} to a decoder.
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passing information about a circuit used for \ac{qec} to a decoder.
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They are also useful as a theoretical tool to aid in the design of
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They are also useful as a theoretical tool to aid in the design of
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fault-tolerant \ac{qec} schemes.
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fault-tolerant \ac{qec} schemes.
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@@ -439,7 +440,7 @@ circuit and each \ac{cn} corresponds to a syndrome measurement.
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% Mathematical definition
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% Mathematical definition
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We describe the circuit code using the \emph{measurement syndrome
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We describe the circuit code using the \emph{measurement syndrome
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matrix} matrix $\bm{\Omega} \in \mathbb{F}_2^{M\times N}$, with
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matrix} $\bm{\Omega} \in \mathbb{F}_2^{M\times N}$, with
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\begin{align*}
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\begin{align*}
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\Omega_{\ell,i} =
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\Omega_{\ell,i} =
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\begin{cases}
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\begin{cases}
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@@ -824,7 +825,7 @@ For two detector matrices $\bm{D}_1$ and $\bm{D}_2$, as long as
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they describe the same set of possible measurement outcomes (under
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they describe the same set of possible measurement outcomes (under
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the absence of noise) and thus the same circuit.
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the absence of noise) and thus the same circuit.
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In fact, as long as \Cref{eq:kern_condition} holds, the detector
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In fact, as long as \Cref{eq:kern_condition} holds, the detector
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error matrices we construct from them can distinguish between the
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error matrices constructed from them can distinguish between the
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same pairs of error sets \cite[Lemma~6]{derks_designing_2025}.
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same pairs of error sets \cite[Lemma~6]{derks_designing_2025}.
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To see this, we note that we can distinguish between two circuit
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To see this, we note that we can distinguish between two circuit
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error vectors $\bm{e}_1$ and $\bm{e}_2$ as long as they do not
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error vectors $\bm{e}_1$ and $\bm{e}_2$ as long as they do not
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@@ -1121,6 +1122,6 @@ include many utilities for building syndrome extraction circuitry automatically.
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The user has to define most, if not all, of the circuit manually,
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The user has to define most, if not all, of the circuit manually,
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depending on the code in question.
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depending on the code in question.
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This is somewhat natural, as stim is meant first and foremost as a
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This is somewhat natural, as stim is meant first and foremost as a
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simulator, and circuit generation is contigent upon the \ac{qec}
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simulator, and circuit generation is contingent upon the \ac{qec}
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scheme in question.
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scheme in question.
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