Add TODOs to fault tolerance chapter
This commit is contained in:
@@ -1,21 +1,144 @@
|
|||||||
|
% TODO: Make all [H] -> [t]
|
||||||
\chapter{Fault Tolerant QEC}
|
\chapter{Fault Tolerant QEC}
|
||||||
\section{Fault Tolerance}
|
|
||||||
|
% Intro
|
||||||
|
|
||||||
|
\content{Syndrome extraction circuitry itself introduces errors}
|
||||||
|
\content{High level explanation of fault tolerance (with figure)}
|
||||||
|
\content{Mathematical definition of fault tolerance}
|
||||||
|
|
||||||
|
% Practical considerations
|
||||||
|
|
||||||
|
\content{We generally need to perform multiple rounds of syndrome extraction}
|
||||||
|
\content{The number of rounds of syndrome extraction is usually
|
||||||
|
chosen equal to the $d_\text{min}$ of the code}
|
||||||
|
\content{One-shot decoding property}
|
||||||
|
|
||||||
|
\begin{figure}[H]
|
||||||
|
\centering
|
||||||
|
|
||||||
|
\begin{tikzpicture}
|
||||||
|
\node[rectangle, draw, fill=orange!20, minimum
|
||||||
|
height=2cm, minimum width=2.5cm, align=left] at (0,0)
|
||||||
|
(internal) {Internal\\ Errors};
|
||||||
|
|
||||||
|
\node[signal, draw, fill=orange!20, minimum height=2cm,
|
||||||
|
minimum width=2.5cm, align=left, signal pointer angle=140]
|
||||||
|
at (-2.45, 0) (input) {Input\\ Errors};
|
||||||
|
|
||||||
|
\node at (1.97,0) {\huge =};
|
||||||
|
|
||||||
|
\node[rectangle, draw, fill=orange!20, minimum height=2cm,
|
||||||
|
minimum width=2.5cm, align=left] at (4,0) (output)
|
||||||
|
{Output\\ Errors};
|
||||||
|
|
||||||
|
\node[above] at (input.north) {\small Input State};
|
||||||
|
\node[above] at (internal.north) {\small QEC};
|
||||||
|
\node[above] at (output.north) {\small Output State};
|
||||||
|
\end{tikzpicture}
|
||||||
|
|
||||||
|
\caption{Sources of error in a fault-tolerant \ac{qec} system.}
|
||||||
|
\end{figure}
|
||||||
|
|
||||||
|
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
|
||||||
\section{Noise Models}
|
\section{Noise Models}
|
||||||
\subsection{Depolarizing Channel}
|
\label{sec:Noise Models}
|
||||||
\subsection{Phenomenological Noise}
|
|
||||||
\subsection{Circuit-Level Noise}
|
|
||||||
\section{Detector Error Models}
|
|
||||||
\subsection{Measurement Syndrome Matrix}
|
|
||||||
\subsection{Detector Error Matrix}
|
|
||||||
\subsection{Detector Error Models}
|
|
||||||
\section{Practical Considerations}
|
|
||||||
\subsection{Practical Methodology}
|
|
||||||
|
|
||||||
\content{Per-round-LER explanation}
|
% Intro
|
||||||
|
|
||||||
\subsection{Stim}
|
\content{Explanation of what a noise model is}
|
||||||
|
\content{Mention there are different types of noise models, each with
|
||||||
|
different possible error locations}
|
||||||
|
|
||||||
\begin{figure}[t]
|
% Figure intro
|
||||||
|
|
||||||
|
\content{\autoref{fig:pure_syndrome_extraction} shows the syndrome
|
||||||
|
extraction circuit of a three-qubit repetition code with stabilizers
|
||||||
|
$Z_1Z_2$ and $Z_2Z_3$. This code is only able to deal with X errors.
|
||||||
|
We will use it as a propotypical model to examine the different types
|
||||||
|
of noise models}
|
||||||
|
\content{This is now a concrete implementation of the syndrome
|
||||||
|
measurement circuit using CNOT gates, as opposed to the system-level
|
||||||
|
view in \autoref{subsec:Stabilizer Codes}}
|
||||||
|
\content{\autoref{fig:noise_model_types} shows a number of diffent
|
||||||
|
types of noise models}
|
||||||
|
|
||||||
|
% Bit-flip noise
|
||||||
|
|
||||||
|
\content{Bit-flip noise}
|
||||||
|
\content{Introduce \emph{data qubits}}
|
||||||
|
\content{Only X errors on data qubits}
|
||||||
|
\content{Most similar to classical channel coding}
|
||||||
|
\content{\textbf{TODO}: What is this useful for? Just as a first step?}
|
||||||
|
|
||||||
|
% Depolarizing channel
|
||||||
|
|
||||||
|
\content{Depolarizing channel}
|
||||||
|
\content{X/Y/Z errors on data qubits}
|
||||||
|
\content{\textbf{TODO}: What does this model? Memory experiment with
|
||||||
|
ideal syndrome extraction?}
|
||||||
|
\content{\textbf{TODO}: Why is it called depolarizing?}
|
||||||
|
|
||||||
|
% Phenomenological noise
|
||||||
|
|
||||||
|
\content{Phenomenological noise}
|
||||||
|
\content{First noise model that considers errors during syndrome extraction}
|
||||||
|
\content{X errors before each syndrome extraction round}
|
||||||
|
\content{X errors before measurements}
|
||||||
|
\content{\textbf{TODO}: Why is this useful? Derks et al. mentioned
|
||||||
|
something about it being useful to derive fault-tolerant circuits}
|
||||||
|
\content{\textbf{TODO}: Make sure phenomenological noise is only X errors}
|
||||||
|
|
||||||
|
% Circuit-level noise
|
||||||
|
|
||||||
|
\content{Circuit-level noise}
|
||||||
|
\content{This is generally what we strive to be able to decode under}
|
||||||
|
\content{X/Y/Z errors before each syndrome extraction round}
|
||||||
|
\content{$n$-qubit Pauli errors after each $n$-qubit Pauli gate}
|
||||||
|
\content{Define $n$-qubit Pauli errors}
|
||||||
|
\content{X errors right before the measurements}
|
||||||
|
\content{Note that the only errors right before the measurements that
|
||||||
|
have any effect on the measurement outcomes are X errors. That is why
|
||||||
|
it is enough to consider this type of error at this point in the circuit.}
|
||||||
|
|
||||||
|
% Different noise models for circuit-level noise
|
||||||
|
|
||||||
|
\content{Comparison from Gidney's paper}
|
||||||
|
\content{In this work we only consider standard circuit-based
|
||||||
|
depolarizing noise}
|
||||||
|
|
||||||
|
\begin{figure}[H]
|
||||||
|
\centering
|
||||||
|
|
||||||
|
\begin{minipage}{0.5\textwidth}
|
||||||
|
\begin{align*}
|
||||||
|
\bm{H} =
|
||||||
|
\begin{pmatrix}
|
||||||
|
1 & 1 & 0 \\
|
||||||
|
0 & 1 & 1
|
||||||
|
\end{pmatrix}
|
||||||
|
\end{align*}
|
||||||
|
\end{minipage}%
|
||||||
|
\begin{minipage}{0.5\textwidth}
|
||||||
|
% tex-fmt: off
|
||||||
|
\begin{quantikz}%[row sep=4mm, column sep=4mm]
|
||||||
|
\lstick[3]{$\ket{\psi}_\text{L}$} & \ctrl{3} & & & & & \\
|
||||||
|
& & \ctrl{2} & \ctrl{3} & & & \\
|
||||||
|
& & & & \ctrl{2} & & \\
|
||||||
|
\lstick{$\ket{0}_{\text{A}_1}$} & \targ{} & \targ{} & & & \meter{} & \setwiretype{c} \\
|
||||||
|
\lstick{$\ket{0}_{\text{A}_2}$} & & & \targ{} & \targ{} & \meter{} & \setwiretype{c}
|
||||||
|
\end{quantikz}
|
||||||
|
% tex-fmt: on
|
||||||
|
\end{minipage}%
|
||||||
|
|
||||||
|
\caption{
|
||||||
|
Syndrome extraction circuit for the three-qubit repetition
|
||||||
|
code under bit-flip noise.
|
||||||
|
}
|
||||||
|
\label{fig:pure_syndrome_extraction}
|
||||||
|
\end{figure}
|
||||||
|
|
||||||
|
\begin{figure}[H]
|
||||||
\centering
|
\centering
|
||||||
|
|
||||||
\newcommand{\xerr}{\gate[style={fill=KITblue!50}]{\phantom{1}}}
|
\newcommand{\xerr}{\gate[style={fill=KITblue!50}]{\phantom{1}}}
|
||||||
@@ -125,67 +248,60 @@
|
|||||||
\end{minipage}
|
\end{minipage}
|
||||||
|
|
||||||
\caption{Types of noise models.}
|
\caption{Types of noise models.}
|
||||||
\label{fig:Types of noise models.}
|
\label{fig:noise_model_types}
|
||||||
\end{figure}
|
\end{figure}
|
||||||
|
|
||||||
\begin{figure}[t]
|
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
|
||||||
\centering
|
\section{Detector Error Models}
|
||||||
|
\label{sec:Detector Error Models}
|
||||||
|
|
||||||
\begin{tikzpicture}
|
\content{\textbf{TODO}: Look up how Derks et al. introduce DEMs}
|
||||||
\node[rectangle, draw, fill=orange!20, minimum
|
|
||||||
height=2cm, minimum width=2.5cm, align=left] at (0,0)
|
|
||||||
(internal) {Internal\\ Errors};
|
|
||||||
|
|
||||||
\node[signal, draw, fill=orange!20, minimum height=2cm,
|
% Different ways of implementing fault tolerance
|
||||||
minimum width=2.5cm, align=left, signal pointer angle=140]
|
|
||||||
at (-2.45, 0) (input) {Input\\ Errors};
|
|
||||||
|
|
||||||
\node at (1.97,0) {\huge =};
|
\content{Ways of implementing fault tolerance different from DEMs}
|
||||||
|
|
||||||
\node[rectangle, draw, fill=orange!20, minimum height=2cm,
|
% Core idea
|
||||||
minimum width=2.5cm, align=left] at (4,0) (output)
|
|
||||||
{Output\\ Errors};
|
|
||||||
|
|
||||||
\node[above] at (input.north) {\small Input State};
|
\content{Model additional error locations in the code}
|
||||||
\node[above] at (internal.north) {\small QEC};
|
\content{Construct ``circuit code'' from original code}
|
||||||
\node[above] at (output.north) {\small Output State};
|
|
||||||
\end{tikzpicture}
|
|
||||||
|
|
||||||
\caption{Sources of error in a fault-tolerant \ac{qec} system.}
|
% Benefits
|
||||||
\end{figure}
|
|
||||||
|
|
||||||
\begin{figure}[t]
|
\content{Benefits of this approach}
|
||||||
\centering
|
|
||||||
|
|
||||||
\begin{minipage}{0.5\textwidth}
|
%%%%%%%%%%%%%%%%
|
||||||
\begin{align*}
|
\subsection{Measurement Syndrome Matrix}
|
||||||
\bm{H} =
|
\label{subsec:Measurement Syndrome Matrix}
|
||||||
\begin{pmatrix}
|
|
||||||
1 & 1 & 0 \\
|
|
||||||
0 & 1 & 1
|
|
||||||
\end{pmatrix}
|
|
||||||
\end{align*}
|
|
||||||
\end{minipage}%
|
|
||||||
\begin{minipage}{0.5\textwidth}
|
|
||||||
% tex-fmt: off
|
|
||||||
\begin{quantikz}%[row sep=4mm, column sep=4mm]
|
|
||||||
\lstick[3]{$\ket{\psi}_\text{L}$} & \ctrl{3} & & & & & \\
|
|
||||||
& & \ctrl{2} & \ctrl{3} & & & \\
|
|
||||||
& & & & \ctrl{2} & & \\
|
|
||||||
\lstick{$\ket{0}_{\text{A}_1}$} & \targ{} & \targ{} & & & \meter{} & \setwiretype{c} \\
|
|
||||||
\lstick{$\ket{0}_{\text{A}_2}$} & & & \targ{} & \targ{} & \meter{} & \setwiretype{c}
|
|
||||||
\end{quantikz}
|
|
||||||
% tex-fmt: on
|
|
||||||
\end{minipage}%
|
|
||||||
|
|
||||||
\caption{
|
% Core idea
|
||||||
Syndrome extraction circuit for the three-qubit repetition
|
|
||||||
code under bit-flip noise.
|
|
||||||
}
|
|
||||||
\label{fig:}
|
|
||||||
\end{figure}
|
|
||||||
|
|
||||||
\begin{figure}[t]
|
\content{Core idea: Matrix describes parity checks \\
|
||||||
|
$\rightarrow$ A column shows which parity checks the
|
||||||
|
corresponding VN contributes to \\
|
||||||
|
$\rightarrow$ View columns as syndromes corresponding to error
|
||||||
|
locations in the circuit
|
||||||
|
}
|
||||||
|
|
||||||
|
% Multiple rounds of syndrome extraction
|
||||||
|
|
||||||
|
% TODO: First introduce syndrome measurement matrix, mathematically
|
||||||
|
% (consult Derks et al.'s paper). Then use the three-qubit repetition
|
||||||
|
% code as an example only
|
||||||
|
\autoref{fig:rep_code_multiple_rounds_bit_flip} shows a circuit
|
||||||
|
performing three rounds of syndrome extraction for the three-qubit
|
||||||
|
repetition code introduced earlier.
|
||||||
|
We are only considering bit-flip noise at this point.
|
||||||
|
For each syndrome extraction round, we get an additional set of
|
||||||
|
syndrome measurements.
|
||||||
|
We combine these measurements by stacking them in a new vector $\bm{s}
|
||||||
|
\in \mathbb{F}_2^{n_\text{rounds}\cdot(n-k)}$.
|
||||||
|
To model this behavior mathematically, we append additional rows to
|
||||||
|
the check matrix.
|
||||||
|
We call this matrix the \emph{measurement syndrome matrix}
|
||||||
|
$\bm{\Omega}$.
|
||||||
|
|
||||||
|
\begin{figure}[H]
|
||||||
\centering
|
\centering
|
||||||
|
|
||||||
\begin{minipage}{0.3\textwidth}
|
\begin{minipage}{0.3\textwidth}
|
||||||
@@ -293,9 +409,10 @@
|
|||||||
Repeated syndrome extraction circuit for the three-qubit
|
Repeated syndrome extraction circuit for the three-qubit
|
||||||
repetition code under bit flip noise.
|
repetition code under bit flip noise.
|
||||||
}
|
}
|
||||||
|
\label{fig:rep_code_multiple_rounds_bit_flip}
|
||||||
\end{figure}
|
\end{figure}
|
||||||
|
|
||||||
\begin{figure}[t]
|
\begin{figure}[H]
|
||||||
\begin{gather*}
|
\begin{gather*}
|
||||||
\hspace*{-33.3mm}%
|
\hspace*{-33.3mm}%
|
||||||
\begin{array}{c}
|
\begin{array}{c}
|
||||||
@@ -388,7 +505,52 @@
|
|||||||
}
|
}
|
||||||
\end{figure}
|
\end{figure}
|
||||||
|
|
||||||
\begin{figure}[t]
|
%%%%%%%%%%%%%%%%
|
||||||
|
\subsection{Detector Error Matrix}
|
||||||
|
\label{subsec:Detector Error Matrix}
|
||||||
|
|
||||||
|
% Core idea
|
||||||
|
|
||||||
|
% TODO: Make this a proper definition?
|
||||||
|
Instead of using the measurements as parity indicators directly, we
|
||||||
|
may wish to combine them in some way.
|
||||||
|
We call such combinations \emph{detectors}.
|
||||||
|
Formally, a detector is a parity constraint on a set of measurement
|
||||||
|
outcomes \cite[Def.~2.1]{derks_designing_2025}.
|
||||||
|
|
||||||
|
\content{Detector matrix}
|
||||||
|
|
||||||
|
\content{Detector error matrix}
|
||||||
|
|
||||||
|
\content{One way of defining the detectors is ...}
|
||||||
|
|
||||||
|
\begin{figure}[H]
|
||||||
|
\centering
|
||||||
|
|
||||||
|
\tikzset{
|
||||||
|
gate/.style={
|
||||||
|
draw, %line width=1pt,
|
||||||
|
minimum height=2cm,
|
||||||
|
}
|
||||||
|
}
|
||||||
|
|
||||||
|
% tex-fmt: off
|
||||||
|
\begin{quantikz}[row sep=2mm, column sep=4mm, wire types={q,q,q,n,n,n}]
|
||||||
|
\lstick[3]{$\ket{\psi}_\text{L}$} & \gate[3]{\text{SE}_1} & & \gate[3]{\text{SE}_2} & & \gate[3]{\text{SE}_3} & & \gate[3]{\text{SE}_4} & \\
|
||||||
|
& & & & & & & & & \setwiretype{n} & \ldots \\
|
||||||
|
& \wire[d][3]{c} & & \wire[d][1]{c} & & \wire[d][1]{c} & & \wire[d][1]{c} & \\
|
||||||
|
& \ctrl[wire=c]{0}\wire[r][1]{c} & \wire[d][1]{c} & \ctrl[vertical wire=c]{1}\wire[r][1]{c} & \wire[d][1]{c} & \ctrl[vertical wire=c]{1}\wire[r][1]{c} & \wire[d][1]{c} & \ctrl[vertical wire=c]{1}\wire[r][1]{c} & \\
|
||||||
|
& & \wire[r][1]{c} & \targ{}\wire[d][1]{c} & \wire[r][1]{c} & \targ{}\wire[d][1]{c} & \wire[r][1]{c} & \targ{}\wire[d][1]{c} & \\
|
||||||
|
& \gate[1]{\bm{D}_1} & & \gate[1]{\bm{D}_2} & & \gate[1]{\bm{D}_3} & & \gate[1]{\bm{D}_4} & \\
|
||||||
|
\end{quantikz}
|
||||||
|
% tex-fmt: on
|
||||||
|
|
||||||
|
\caption{Construction of detectors from measurements in the general case.}
|
||||||
|
\end{figure}
|
||||||
|
|
||||||
|
\content{The three-qubit repetition code as an exmaple}
|
||||||
|
|
||||||
|
\begin{figure}[H]
|
||||||
\centering
|
\centering
|
||||||
|
|
||||||
\hspace*{-5mm}
|
\hspace*{-5mm}
|
||||||
@@ -444,27 +606,38 @@
|
|||||||
\label{fig:Construction of the detectors from the measurements}
|
\label{fig:Construction of the detectors from the measurements}
|
||||||
\end{figure}
|
\end{figure}
|
||||||
|
|
||||||
\begin{figure}[t]
|
%%%%%%%%%%%%%%%%
|
||||||
\centering
|
\subsection{Detector Error Models}
|
||||||
|
\label{subsec:Detector Error Models}
|
||||||
|
|
||||||
\tikzset{
|
\content{Combination of detector error matrix and noise model}
|
||||||
gate/.style={
|
\content{Contains all information necessary for decoding
|
||||||
draw, %line width=1pt,
|
\cite[Intro.]{derks_designing_2025}}
|
||||||
minimum height=2cm,
|
\content{Not only useful for decoding, but also for ... (Derks et al.)}
|
||||||
}
|
|
||||||
}
|
|
||||||
|
|
||||||
% tex-fmt: off
|
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
|
||||||
\begin{quantikz}[row sep=2mm, column sep=4mm, wire types={q,q,q,n,n,n}]
|
\section{Practical Considerations}
|
||||||
\lstick[3]{$\ket{\psi}_\text{L}$} & \gate[3]{\text{SE}_1} & & \gate[3]{\text{SE}_2} & & \gate[3]{\text{SE}_3} & & \gate[3]{\text{SE}_4} & \\
|
\label{sec:Practical Considerations}
|
||||||
& & & & & & & & & \setwiretype{n} & \ldots \\
|
|
||||||
& \wire[d][3]{c} & & \wire[d][1]{c} & & \wire[d][1]{c} & & \wire[d][1]{c} & \\
|
|
||||||
& \ctrl[wire=c]{0}\wire[r][1]{c} & \wire[d][1]{c} & \ctrl[vertical wire=c]{1}\wire[r][1]{c} & \wire[d][1]{c} & \ctrl[vertical wire=c]{1}\wire[r][1]{c} & \wire[d][1]{c} & \ctrl[vertical wire=c]{1}\wire[r][1]{c} & \\
|
|
||||||
& & \wire[r][1]{c} & \targ{}\wire[d][1]{c} & \wire[r][1]{c} & \targ{}\wire[d][1]{c} & \wire[r][1]{c} & \targ{}\wire[d][1]{c} & \\
|
|
||||||
& \gate[1]{\bm{D}_1} & & \gate[1]{\bm{D}_2} & & \gate[1]{\bm{D}_3} & & \gate[1]{\bm{D}_4} & \\
|
|
||||||
\end{quantikz}
|
|
||||||
% tex-fmt: on
|
|
||||||
|
|
||||||
\caption{Construction of detectors from measurements in the general case.}
|
% Intro
|
||||||
\end{figure}
|
|
||||||
|
\content{Intro}
|
||||||
|
|
||||||
|
%%%%%%%%%%%%%%%%
|
||||||
|
\subsection{Practical Methodology}
|
||||||
|
\label{subsec:Practical Methodology}
|
||||||
|
|
||||||
|
\content{Per-round-LER explanation}
|
||||||
|
|
||||||
|
%%%%%%%%%%%%%%%%
|
||||||
|
\subsection{Stim}
|
||||||
|
\label{subsec:Stim}
|
||||||
|
|
||||||
|
\content{Circuit code heavily depends on the exact circuit construction}
|
||||||
|
\content{Not easy to predict how errors at different locations
|
||||||
|
propagate through the circuit an what detectors they affect}
|
||||||
|
|
||||||
|
\content{Stim is a software package that generates DEMs from circuits}
|
||||||
|
\content{The user still has to define the circuit themselves, and
|
||||||
|
especially the detectors \cite[Sec~2.5]{derks_designing_2025}}
|
||||||
|
|
||||||
|
|||||||
@@ -1,3 +1,4 @@
|
|||||||
|
% TODO: Make all [H] -> [t]
|
||||||
\chapter{Decoding under Detector Error Models}
|
\chapter{Decoding under Detector Error Models}
|
||||||
|
|
||||||
% Intro
|
% Intro
|
||||||
|
|||||||
Reference in New Issue
Block a user